Research Catalog

  • Pattern recognition principles [by] Julius T. Tou [and] Rafael C. Gonzalez.

    • Text
    • Reading, Mass., Addison-Wesley Pub. Co., 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 75-664Offsite
  • Practical approach to pattern classification / Bruce G. Batchelor.

    • Text
    • London ; New York : Plenum Press, 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 77-26Offsite
  • Syntactic pattern recognition : applications / edited by K. S. Fu ; with contributions by J. E. Albus ... [et al.].

    • Text
    • Berlin ; New York : Springer-Verlag, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 77-677Offsite
  • Data structures, computer graphics, and pattern recognition / edited by A. Klinger, K. S. Fu, T. L. Kunii.

    • Text
    • New York : Academic Press, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 78-50Offsite
  • Interactive pattern recognition / Yi-Tzuu Chien.

    • Text
    • New York : M. Dekker, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 78-719Offsite
  • Algorithms for graphics and image processing / Theo Pavlidis.

    • Text
    • Rockville, MD : Computer Science Press, c1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 82-401Offsite
  • Failure diagnosis and performance monitoring / L.F. Pau.

    • Text
    • New York : M. Dekker, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 81-1216Offsite
  • Machine perception / Ramakant Nevatia.

    • Text
    • Englewood Cliffs, N.J. : Prentice-Hall, c1982.
    • 1982
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 83-637Offsite
  • Pattern models / Narendra Ahuja, Bruce J. Schachter.

    • Text
    • New York : Wiley, c1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 84-1023Offsite
  • VLSI for pattern recognition and image processing / editor, King-sun Fu.

    • Text
    • Berlin ; New York : Springer-Verlag, 1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 85-966Offsite
  • Pictorial data analysis / edited by Robert M. Haralick.

    • Text
    • Berlin ; New York : Springer-Verlag, 1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 85-300Offsite
  • Handbook of pattern recognition and image processing / edited by Tzay Y. Young, King-Sun Fu.

    • Text
    • Orlando : Academic Press, 1986-1994.
    • 1986-1994
    • 2 Items
    FormatCall NumberItem Location
    Book/text JSL 95-203Offsite
    FormatCall NumberItem Location
    Book/text JSL 95-203Offsite
  • Pattern recognition : applications to large data-set problems / Sing-Tze Bow.

    • Text
    • New York : M. Dekker, c1984.
    • 1984
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 86-498Offsite
  • Model-based image matching using location / Henry S. Baird.

    • Text
    • Cambridge, Mass. : MIT Press, c1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 86-2160Offsite
  • Pattern recognition problems in geology and paleontology / Ulf Bayer.

    • Text
    • Berlin ; New York : Springer-Verlag, c1985.
    • 1985
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 86-1363Offsite
  • Pattern recognition by humans and machines / [edited] by Eileen C. Schwab, Howard C. Nusbaum.

    • Text
    • Orlanda, Fla. : Academic Press, 1986.
    • 1986
    • 2 Items
    FormatCall NumberItem Location
    Book/text JFE 87-3826Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

    FormatCall NumberItem Location
    Book/text JFE 87-3826Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Robotic object recognition using vision and touch / by Peter K. Allen.

    • Text
    • Boston : Kluwer Academic Publishers, c1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 88-2273Offsite
  • Pattern recognition / Mike James.

    • Text
    • New York : Wiley, c1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 88-3462Offsite
  • Adaptive pattern recognition and neural networks / Yoh-Han Pao.

    • Text
    • Reading, Mass. : Addison-Wesley, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 90-393Offsite
  • Image analysis applications / edited by Rangachar Kasturi, Mohan M. Trivedi.

    • Text
    • New York : M. Dekker, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 91-1597Offsite
  • Pattern recognition by self-organizing neural networks / edited by Gail A. Carpenter and Stephen Grossberg.

    • Text
    • Cambridge, Mass. : MIT Press, c1991.
    • 1991
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSF 92-533Offsite
  • A program generator for recognition, parsing and transduction with syntactic patterns / G.J. van der Steen.

    • Text
    • Amsterdam : Centrum voor Wiskunde en Informatica, c1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSF 93-545Offsite
  • Pattern recognition engineering / Morton Nadler, Eric P. Smith.

    • Text
    • New York : Wiley, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 93-1010Offsite
  • Pattern recognition and image preprocessing / Sing-Tze Bow.

    • Text
    • New York : M. Dekker, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 93-1705Offsite
  • Neural networks for pattern recognition / Albert Nigrin.

    • Text
    • Cambridge, Mass. : MIT Press, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 94-807Offsite
  • Advances in pattern recognition systems using neural network technologies / edited by I. Guyon, P.S.P. Wang.

    • Text
    • Singapore ; River Edge, NJ : World Scientific, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSF 94-609Offsite
  • From statistics to neural networks : theory and pattern recognition applications / edited by Vladimir Cherkassky, Jerome H. Friedman, Harry Wechsler.

    • Text
    • Berlin ; New York : Springer-Verlag, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 95-279Offsite
  • Image based measurement systems : object recognition and parameter estimation / Ferdinand van der Heijden.

    • Text
    • Chichester ; New York, N.Y. : J. Wiley and Sons, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 95-348Offsite
  • Pattern classification : a unified view of statistical and neural approaches / Jürgen Schürmann.

    • Text
    • New York : Wiley, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 96-693Offsite
  • Pattern recognition and prediction with applications to signal characterization / David H. Kil, Frances B. Shin.

    • Text
    • Woodbury, N.Y. : AIP Press, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 96-1331Offsite
  • Fuzzy algorithms : with applications to image processing and pattern recognition / Zheru Chi, Hong Yan, Tuan Pham.

    • Text
    • Singapore ; River Edge, N.J. : World Scientific, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSD 97-8Offsite
  • Automatic modulation recognition of communication signals / by Elsayed Elsayed Azzouz and Asoke Kumar Nandi.

    • Text
    • Boston : Kluwer Academic Publishers, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 97-135Offsite
  • Neural networks for pattern recognition / Christopher M. Bishop.

    • Text
    • Oxford : Clarendon Press ; New York : Oxford University Press, 1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 97-1673Offsite
    Not available - In use until 2024-01-26 - Please for assistance.
  • Semantic networks for understanding scenes / Gerhard Sagerer and Heinrich Niemann.

    • Text
    • New York ; London : Plenum Press, c1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 97-1214Offsite
  • Neural networks and pattern recognition / edited by Omid Omidvar, Judith Dayhoff.

    • Text
    • San Diego, Calif. ; London : Academic Press, c1998.
    • 1998
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 97-1693Offsite
  • Pattern analysis / U. Grenander.

    • Text
    • New York : Springer-Verlag, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSL 94-36Offsite
  • Pattern synthesis / U. Grenander.

    • Text
    • New York : Springer-Verlag, 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSL 94-36Offsite
  • Pattern recognition using neural networks : theory and algorithms for engineers and scientists / Carl G. Looney.

    • Text
    • New York : Oxford University Press, 1997.
    • 1997
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 99-1429Offsite
  • Neuro-fuzzy pattern recognition : methods in soft computing / Sankar K. Pal, Sushmita Mitra.

    • Text
    • New York ; Chichester [England] : Wiley, c1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 99-1940Offsite
  • Biometrics : personal identification in networked society / edited by Anil K. Jain and Ruud Bolle and Sharath Pankanti.

    • Text
    • Boston : Kluwer, c1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 00-503Offsite
  • Supervised and unsupervised pattern recognition : feature extraction and computational intelligence / Evangelia Micheli-Tzanako.

    • Text
    • Boca Raton, Fla. : CRC Press, c2000.
    • 2000
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 00-828Offsite
  • Solving data mining problems through pattern recognition / by Ruby L. Kennedy ... [et al.].

    • Text
    • Upper Saddle River, N.J. : Prentice Hall PTR, c1997.
    • 1997
    • 2 Items
    FormatCall NumberItem Location
    Book/text *WSC-1335Offsite
    FormatCall NumberItem Location
    Book/text JSE 00-1337 [Text]Offsite
  • Automated biometrics : technologies and systems / by David D. Zhang.

    • Text
    • Boston ; London : Kluwer Academic Publishers, c2000.
    • 2000
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 00-1590Offsite
  • Distortion-tolerant filter for elastic-distorted fingerprint matching [microform] / C.I. Watson, P.J. Grother, D.P. Casasent.

    • Text
    • [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
    • 2000
  • The Mahalanobis-Taguchi system / Genichi Taguchi, Subir Chowdhury, Yuin Wu.

    • Text
    • New York : McGraw-Hill, 2001.
    • 2001
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 01-722Offsite
  • Neuro-fuzzy pattern recognition : editors H. Bunke, A. Kandel.

    • Text
    • Singapore ; River Edge, N.J. : World Scientific, 2000.
    • 2000
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSD 01-96Offsite
  • Statistical and neural classifiers : an integrated approach to design / Sarunas Raudys.

    • Text
    • London ; [New York] : Springer, c2001.
    • 2001
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 01-735Offsite
  • Introduction to pattern recognition : statistical, structural, neural, and fuzzy logic approaches / Menahem Friedman, Abraham Kandel.

    • Text
    • Singapore ; River Edge, N.J. : World Scientific, c1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSF 01-583Offsite
  • Studies in pattern recognition : a memorial to the late Professor Kin-Sun Fu / editor, H. Freeman.

    • Text
    • Singapore ; River Edge, NJ : World Scientific, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSF 01-585Offsite
  • Pattern classification : neuro-fuzzy methods and their comparison / Shigeo Abe.

    • Text
    • London ; New York : Springer, c2001.
    • 2001
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 01-1271Offsite

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