Research Catalog
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Displaying 1-50 of 249 results
Pattern recognition principles [by] Julius T. Tou [and] Rafael C. Gonzalez.
- Text
- Reading, Mass., Addison-Wesley Pub. Co., 1974.
- 1974
- 1 Item
Item details Format Call Number Item Location Book/text JSE 75-664 Offsite Practical approach to pattern classification / Bruce G. Batchelor.
- Text
- London ; New York : Plenum Press, 1974.
- 1974
- 1 Item
Item details Format Call Number Item Location Book/text JSE 77-26 Offsite Syntactic pattern recognition : applications / edited by K. S. Fu ; with contributions by J. E. Albus ... [et al.].
- Text
- Berlin ; New York : Springer-Verlag, 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Book/text JSE 77-677 Offsite Data structures, computer graphics, and pattern recognition / edited by A. Klinger, K. S. Fu, T. L. Kunii.
- Text
- New York : Academic Press, 1977.
- 1977
- 1 Item
Item details Format Call Number Item Location Book/text JSE 78-50 Offsite Interactive pattern recognition / Yi-Tzuu Chien.
- Text
- New York : M. Dekker, c1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Book/text JSE 78-719 Offsite Algorithms for graphics and image processing / Theo Pavlidis.
- Text
- Rockville, MD : Computer Science Press, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Book/text JSE 82-401 Offsite Failure diagnosis and performance monitoring / L.F. Pau.
- Text
- New York : M. Dekker, c1981.
- 1981
- 1 Item
Item details Format Call Number Item Location Book/text JSE 81-1216 Offsite Machine perception / Ramakant Nevatia.
- Text
- Englewood Cliffs, N.J. : Prentice-Hall, c1982.
- 1982
- 1 Item
Item details Format Call Number Item Location Book/text JSE 83-637 Offsite Pattern models / Narendra Ahuja, Bruce J. Schachter.
- Text
- New York : Wiley, c1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Book/text JSE 84-1023 Offsite VLSI for pattern recognition and image processing / editor, King-sun Fu.
- Text
- Berlin ; New York : Springer-Verlag, 1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 85-966 Offsite Pictorial data analysis / edited by Robert M. Haralick.
- Text
- Berlin ; New York : Springer-Verlag, 1983.
- 1983
- 1 Item
Item details Format Call Number Item Location Book/text JSE 85-300 Offsite Handbook of pattern recognition and image processing / edited by Tzay Y. Young, King-Sun Fu.
- Text
- Orlando : Academic Press, 1986-1994.
- 1986-1994
- 2 Items
Item details Format Call Number Item Location Book/text JSL 95-203 Offsite Item details Format Call Number Item Location Book/text JSL 95-203 Offsite Pattern recognition : applications to large data-set problems / Sing-Tze Bow.
- Text
- New York : M. Dekker, c1984.
- 1984
- 1 Item
Item details Format Call Number Item Location Book/text JSE 86-498 Offsite Model-based image matching using location / Henry S. Baird.
- Text
- Cambridge, Mass. : MIT Press, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Book/text JSE 86-2160 Offsite Pattern recognition problems in geology and paleontology / Ulf Bayer.
- Text
- Berlin ; New York : Springer-Verlag, c1985.
- 1985
- 1 Item
Item details Format Call Number Item Location Book/text JSE 86-1363 Offsite Pattern recognition by humans and machines / [edited] by Eileen C. Schwab, Howard C. Nusbaum.
- Text
- Orlanda, Fla. : Academic Press, 1986.
- 1986
- 2 Items
Item details Format Call Number Item Location Book/text JFE 87-3826 Schwarzman Building - General Research Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Item details Format Call Number Item Location Book/text JFE 87-3826 Schwarzman Building - General Research Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Robotic object recognition using vision and touch / by Peter K. Allen.
- Text
- Boston : Kluwer Academic Publishers, c1987.
- 1987
- 1 Item
Item details Format Call Number Item Location Book/text JSE 88-2273 Offsite Pattern recognition / Mike James.
- Text
- New York : Wiley, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Book/text JSE 88-3462 Offsite Adaptive pattern recognition and neural networks / Yoh-Han Pao.
- Text
- Reading, Mass. : Addison-Wesley, c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Book/text JSE 90-393 Offsite Image analysis applications / edited by Rangachar Kasturi, Mohan M. Trivedi.
- Text
- New York : M. Dekker, c1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Book/text JSE 91-1597 Offsite Pattern recognition by self-organizing neural networks / edited by Gail A. Carpenter and Stephen Grossberg.
- Text
- Cambridge, Mass. : MIT Press, c1991.
- 1991
- 1 Item
Item details Format Call Number Item Location Book/text JSF 92-533 Offsite A program generator for recognition, parsing and transduction with syntactic patterns / G.J. van der Steen.
- Text
- Amsterdam : Centrum voor Wiskunde en Informatica, c1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Book/Text JSF 93-545 Offsite Pattern recognition engineering / Morton Nadler, Eric P. Smith.
- Text
- New York : Wiley, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 93-1010 Offsite Pattern recognition and image preprocessing / Sing-Tze Bow.
- Text
- New York : M. Dekker, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 93-1705 Offsite Neural networks for pattern recognition / Albert Nigrin.
- Text
- Cambridge, Mass. : MIT Press, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 94-807 Offsite Advances in pattern recognition systems using neural network technologies / edited by I. Guyon, P.S.P. Wang.
- Text
- Singapore ; River Edge, NJ : World Scientific, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Book/Text JSF 94-609 Offsite From statistics to neural networks : theory and pattern recognition applications / edited by Vladimir Cherkassky, Jerome H. Friedman, Harry Wechsler.
- Text
- Berlin ; New York : Springer-Verlag, c1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Book/text JSE 95-279 Offsite Image based measurement systems : object recognition and parameter estimation / Ferdinand van der Heijden.
- Text
- Chichester ; New York, N.Y. : J. Wiley and Sons, c1994.
- 1994
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 95-348 Offsite Pattern classification : a unified view of statistical and neural approaches / Jürgen Schürmann.
- Text
- New York : Wiley, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 96-693 Offsite Pattern recognition and prediction with applications to signal characterization / David H. Kil, Frances B. Shin.
- Text
- Woodbury, N.Y. : AIP Press, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Book/text JSE 96-1331 Offsite Fuzzy algorithms : with applications to image processing and pattern recognition / Zheru Chi, Hong Yan, Tuan Pham.
- Text
- Singapore ; River Edge, N.J. : World Scientific, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Book/Text JSD 97-8 Offsite Automatic modulation recognition of communication signals / by Elsayed Elsayed Azzouz and Asoke Kumar Nandi.
- Text
- Boston : Kluwer Academic Publishers, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 97-135 Offsite Neural networks for pattern recognition / Christopher M. Bishop.
- Text
- Oxford : Clarendon Press ; New York : Oxford University Press, 1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 97-1673 Offsite Not available - In use until 2024-01-26 - Please for assistance.Semantic networks for understanding scenes / Gerhard Sagerer and Heinrich Niemann.
- Text
- New York ; London : Plenum Press, c1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 97-1214 Offsite Neural networks and pattern recognition / edited by Omid Omidvar, Judith Dayhoff.
- Text
- San Diego, Calif. ; London : Academic Press, c1998.
- 1998
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 97-1693 Offsite Pattern analysis / U. Grenander.
- Text
- New York : Springer-Verlag, c1978.
- 1978
- 1 Item
Item details Format Call Number Item Location Book/text JSL 94-36 Offsite Pattern synthesis / U. Grenander.
- Text
- New York : Springer-Verlag, 1976.
- 1976
- 1 Item
Item details Format Call Number Item Location Book/text JSL 94-36 Offsite Pattern recognition using neural networks : theory and algorithms for engineers and scientists / Carl G. Looney.
- Text
- New York : Oxford University Press, 1997.
- 1997
- 1 Item
Item details Format Call Number Item Location Book/text JSE 99-1429 Offsite Neuro-fuzzy pattern recognition : methods in soft computing / Sankar K. Pal, Sushmita Mitra.
- Text
- New York ; Chichester [England] : Wiley, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 99-1940 Offsite Biometrics : personal identification in networked society / edited by Anil K. Jain and Ruud Bolle and Sharath Pankanti.
- Text
- Boston : Kluwer, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 00-503 Offsite Supervised and unsupervised pattern recognition : feature extraction and computational intelligence / Evangelia Micheli-Tzanako.
- Text
- Boca Raton, Fla. : CRC Press, c2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 00-828 Offsite Solving data mining problems through pattern recognition / by Ruby L. Kennedy ... [et al.].
- Text
- Upper Saddle River, N.J. : Prentice Hall PTR, c1997.
- 1997
- 2 Items
Item details Format Call Number Item Location Book/text *WSC-1335 Offsite Item details Format Call Number Item Location Book/text JSE 00-1337 [Text] Offsite Automated biometrics : technologies and systems / by David D. Zhang.
- Text
- Boston ; London : Kluwer Academic Publishers, c2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 00-1590 Offsite Distortion-tolerant filter for elastic-distorted fingerprint matching [microform] / C.I. Watson, P.J. Grother, D.P. Casasent.
- Text
- [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
- 2000
The Mahalanobis-Taguchi system / Genichi Taguchi, Subir Chowdhury, Yuin Wu.
- Text
- New York : McGraw-Hill, 2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Book/Text JSE 01-722 Offsite Neuro-fuzzy pattern recognition : editors H. Bunke, A. Kandel.
- Text
- Singapore ; River Edge, N.J. : World Scientific, 2000.
- 2000
- 1 Item
Item details Format Call Number Item Location Book/Text JSD 01-96 Offsite Statistical and neural classifiers : an integrated approach to design / Sarunas Raudys.
- Text
- London ; [New York] : Springer, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Book/text JSE 01-735 Offsite Introduction to pattern recognition : statistical, structural, neural, and fuzzy logic approaches / Menahem Friedman, Abraham Kandel.
- Text
- Singapore ; River Edge, N.J. : World Scientific, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Book/text JSF 01-583 Offsite Studies in pattern recognition : a memorial to the late Professor Kin-Sun Fu / editor, H. Freeman.
- Text
- Singapore ; River Edge, NJ : World Scientific, c1996.
- 1996
- 1 Item
Item details Format Call Number Item Location Book/Text JSF 01-585 Offsite Pattern classification : neuro-fuzzy methods and their comparison / Shigeo Abe.
- Text
- London ; New York : Springer, c2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Book/text JSE 01-1271 Offsite
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