Research Catalog

  • Pattern recognition; proceedings. Edited by Laveen N. Kanal.

    • Text
    • Washington, Thompson Book Co., 1968.
    • 1968
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 72-744Offsite
  • Introduction to mathematical techniques in pattern recognition [by] Harry C. Andrews.

    • Text
    • New York, Wiley-Interscience [1972]
    • 1972
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSD 73-188Offsite
  • Pattern apprehension: the development of international representations. [By] Abram R. W. Muijen.

    • Text
    • Amsterdam, Swets & Zeitlinger, 1972.
    • 1972
    • 1 Item
    FormatCall NumberItem Location
    Book/text JFE 73-851Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Pattern recognition: introduction and foundations.

    • Text
    • Stroudsburg, Pa., Dowden, Hutchinson & Ross [1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSF 74-185Offsite
  • Psychological processes in pattern recognition [by] Stephen K. Reed.

    • Text
    • New York, Academic Press, 1973.
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Book/text JFE 74-1805Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Syntactic methods in pattern recognition [by] K. S. Fu.

    • Text
    • New York, Academic Press, 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 75-239Offsite
  • Pattern recognition principles [by] Julius T. Tou [and] Rafael C. Gonzalez.

    • Text
    • Reading, Mass., Addison-Wesley Pub. Co., 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 75-664Offsite
  • Chemical applications of pattern recognition / Peter C. Jurs, Thomas L. Isenhour.

    • Text
    • New York : Wiley, [1975]
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 75-772Offsite
  • Patterns and configurations in economic science, by J. M. Blin.

    • Text
    • Dordrecht, Holland, Boston, D. Reidel Pub. Co. [1973]
    • 1973
    • 1 Item
    FormatCall NumberItem Location
    Book/text JLD 75-1878Offsite
  • Recognition of patterns using the frequencies of occurrence of binary words [by] Peter W. Becker. 2d rev. ed.

    • Text
    • Wien, New York, Springer-Verlag [1974]
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSD 75-1070Offsite
  • Raspoznavanie obrazov.

    • Text
    • Riga, Izd-vo "Zinatne", 1974-
    • 1974-19
    • 2 Items
    FormatCall NumberItem Location
    Book/text *QHA 75-948Offsite
    FormatCall NumberItem Location
    Book/text *QHA 75-948Offsite
  • Classification, estimation, and pattern recognition [by] Tzay Y. Young [and] Thomas W. Calvert.

    • Text
    • New York, American Elsevier Pub. Co. [1974]
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSD 75-1251Offsite
  • Practical approach to pattern classification / Bruce G. Batchelor.

    • Text
    • London ; New York : Plenum Press, 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 77-26Offsite
  • Methoden der Mustererkennung.

    • Text
    • Frankfurt am Main, Akademische Verlagsgesellschaft, 1974.
    • 1974
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSD 76-868Offsite
  • Digital pattern recognition / edited by K. S. Fu ; with contributions by T. M. Cover ... [et al.].

    • Text
    • Berlin ; New York : Springer-Verlag, 1976.
    • 1976
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 76-799Offsite
  • Syntactic pattern recognition : applications / edited by K. S. Fu ; with contributions by J. E. Albus ... [et al.].

    • Text
    • Berlin ; New York : Springer-Verlag, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 77-677Offsite
  • Syntactic pattern recognition : an introduction / Rafael C. Gonzalez, Michael G. Thomason.

    • Text
    • Reading, Mass. : Addison-Wesley Pub. Co., Advanced Book Program, 1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 79-287Offsite
  • Pattern recognition : ideas in practice / edited by Bruce G. Batchelor.

    • Text
    • New York : Plenum Press, c1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 79-360Offsite
  • Polynomklassifikatoren für die Zeichenerkennung : Ansatz, Adaption, Anwendungen / von Jürgen Schürmann. 1. Aufl.

    • Text
    • München ; Wien : Oldenbourg, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 79-711Offsite
  • Structural pattern recognition / T. Pavlidis.

    • Text
    • Berlin ; New York : Springer-Verlag, 1977.
    • 1977
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 80-158Offsite
  • Grundlagen der technischen Erkennung / Rolf Peipmann. 1. Aufl.

    • Text
    • Berlin : Verlag Technik, 1975.
    • 1975
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSD 81-110Offsite
  • Pattern recognition with fuzzy objective function algorithms / James C. Bezdek.

    • Text
    • New York : Plenum Press, c1981.
    • 1981
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 81-1646Offsite
  • Learning systems : decision, simulation, and control / Yousri M. El-Fattah, Claude Foulard.

    • Text
    • Berlin ; New York : Springer-Verlag, 1978.
    • 1978
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 84-622Offsite
  • Fuzzy mathematical approach to pattern recognition / Sankar K. Pal, Dwijesh K. Dutta Majumder.

    • Text
    • New York : Wiley, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 88-1776Offsite
  • Structural methods in pattern recognition / by Laurent Miclet ; translated by J. Howlett.

    • Text
    • New York : Springer-Verlag, 1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 87-1445Offsite
  • Subspace methods of pattern recognition / E. Oja.

    • Text
    • Letchworth, Hertfordshire, England : Research Studies Press ; New York : Wiley, c1983.
    • 1983
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 86-1752Offsite
  • Knowledge as design / D.N. Perkins.

    • Text
    • Hillsdale, N.J. : L. Erlbaum Associates, 1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Book/text JFE 86-5116Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Pattern recognition by humans and machines / [edited] by Eileen C. Schwab, Howard C. Nusbaum.

    • Text
    • Orlanda, Fla. : Academic Press, 1986.
    • 1986
    • 2 Items
    FormatCall NumberItem Location
    Book/text JFE 87-3826Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

    FormatCall NumberItem Location
    Book/text JFE 87-3826Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Potential pattern recognition in chemical and medical decision making / D. Coomans, I. Broeckaert.

    • Text
    • Letchworth, Hertfordshire, England : Research Studies Press ; New York : Wiley, c1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 87-2152Offsite
  • Visual reconstruction / Andrew Blake and Andrew Zisserman.

    • Text
    • Cambridge, Mass. : MIT Press, c1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 88-2100Offsite
  • Patterns, thinking, and cognition : a theory of judgment / Howard Margolis.

    • Text
    • Chicago : University of Chicago Press, 1987.
    • 1987
    • 1 Item
    FormatCall NumberItem Location
    Book/text JFE 88-4614Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Application of pattern recognition to catalytic research / I.I. Ioffe.

    • Text
    • Letchworth, Hertfordshire, England : Research Studies Press ; New York : Wiley, 1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 88-3610Offsite
  • Visual pattern analyzers / Norma von Surdam Graham.

    • Text
    • New York : Oxford University Press, 1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 89-1491Offsite
  • Pattern analysis and understanding / Heinrich Niemann.

    • Text
    • Berlin ; New York : Springer-Verlag, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 90-662Offsite
  • Fundamentals of pattern recognition / Monique Pavel.

    • Text
    • New York : M. Dekker, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 88-998Offsite
  • Modeling one dimensional pattern formation by anti-diffusion / J.F. Kaashoek.

    • Text
    • Amsterdam, The Netherlands : Centrum voor Wiskunde en Informatica, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 91-368Offsite
  • Plan recognition in natural language dialogue / Sandra Carberry.

    • Text
    • Cambridge, Mass. : MIT Press, c1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Book/text JFE 91-4589Schwarzman Building - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Fundamentals of pattern recognition / Monique Pavel.

    • Text
    • New York : M. Dekker, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 93-548Offsite
  • Pattern recognition and machine learning / Yuichiro Anzai.

    • Text
    • Boston : Academic Press, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 93-890Offsite
  • Discriminant analysis and statistical pattern recognition / Geoffrey J. McLachlan.

    • Text
    • New York : Wiley, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 93-1489Offsite
  • Runs and patterns in probability : selected papers / edited by Anant P. Godbole and Stavros G. Papastavridis.

    • Text
    • Dordrecht ; Boston : Kluwer Academic, c1994.
    • 1994
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 95-1568Offsite
  • Groups and symmetry : a guide to discovering mathematics / David W. Farmer.

    • Text
    • Providence, R.I. : American Mathematical Society, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSF 96-834Offsite
  • Pattern classification : a unified view of statistical and neural approaches / Jürgen Schürmann.

    • Text
    • New York : Wiley, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 96-693Offsite
  • A probabilistic theory of pattern recognition / Luc Devroye, László Györfi, Gábor Lugosi.

    • Text
    • New York : Springer, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSE 96-778Offsite
  • Genetic algorithms for pattern recognition / edited by Sankar K. Pal, Paul P. Wang.

    • Text
    • Boca Raton, FL : CRC Press, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 96-1066Offsite
  • Pattern formation in liquid crystals / Agnes Buka, Lorenz Kramer, editors.

    • Text
    • New York : Springer, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/text JSE 96-1058Offsite
  • Machine learning and perception / editors, Guido Tascini ... [et al.]

    • Text
    • Singapore ; New Jersey : World Scientific, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSD 97-6Offsite
  • Pattern formation in diffusion-limited crystal growth / Klaus Kassner.

    • Text
    • Singapore ; River Edge, NJ : World Scientific, c1996.
    • 1996
    • 1 Item
    FormatCall NumberItem Location
    Book/Text JSD 96-179Offsite
  • Recognition: a study in the philosophy of artificial intelligence, by Kenneth M. Sayre.

    • Text
    • [Notre Dame, Ind.] University of Notre Dame Press, 1965.
    • 1965
    • 1 Item
    FormatCall NumberItem Location
    Book/text D-17 3542Schwarzman Building - Main Reading Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Recognizing patterns; studies in living and automatic systems. Editors: Paul A. Kolers [and] Murray Eden. Contributors: Shin-Ho Chung [and others]

    • Text
    • Cambridge, Mass., M.I.T. Press [1968]
    • 1968
    • 1 Item
    FormatCall NumberItem Location
    Book/text E-13 2849Schwarzman Building - Main Reading Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

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