- Additional Authors
- National Institute of Standards and Technology (U.S.)
- Description
- 23 p. : ill.
- Series Statement
- NISTIR ; 6140
- Subject
- Note
- Shipping list no.: 98-0864-M.
- "February 1998."
- Bibliography (note)
- Includes bibliographical references (p. 18-20).
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.58:6140
- OCLC
- 40222052
- Author
Kuhn, D. Richard.
- Title
Fault classes and error detection in specification based testing [microform] / D. Richard Kuhn.
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
- Series
NISTIR ; 6140
- Bibliography
Includes bibliographical references (p. 18-20).
- Reproduction
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative.
- Added Author
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0247-D (MF)
- Sudoc No.
C 13.58:6140
- Research Call Number
READEX Microfiche C 13.58:6140