Research Catalog

Optical metrology for industrialization of optical information processing

Title
Optical metrology for industrialization of optical information processing / David Casasent, C.L. Wilson.
Author
Casasent, D. P. (David Paul)
Publication
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]

Details

Additional Authors
  • Wilson, Charles L., 1942-
  • National Institute of Standards and Technology (U.S.) https://id.oclc.org/worldcat/entity/E39QQPVp7Xvm946VBfBbQwgB7R
Description
12 pages : illustrations; 28 cm
Series Statement
NISTIR ; 6060
Uniform Title
NISTIR ; 6060.
Subject
  • Optical data processing
  • Optical pattern recognition
  • Information storage and retrieval systems
Note
  • Shipping list no.: 98-0569-M.
  • "September, 1997."
Bibliography (note)
  • Includes bibliographical references (pages 11-12).
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche C 13.58:6060
OCLC
39138979
Author
Casasent, D. P. (David Paul)
Title
Optical metrology for industrialization of optical information processing / David Casasent, C.L. Wilson.
Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]
Type of Content
text
Type of Medium
microform
Type of Carrier
microfiche
Series
NISTIR ; 6060
NISTIR ; 6060. http://id.loc.gov/authorities/names/n88507971
Bibliography
Includes bibliographical references (pages 11-12).
Reproduction
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998]. 1 microfiche : negative.
Added Author
Wilson, Charles L., 1942-
National Institute of Standards and Technology (U.S.)
Gpo Item No.
0247-D (MF)
Sudoc No.
C 13.58:6060
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