Research Catalog
Manufacturing yield evaluation of VLSI/WSI systems
- Title
- Manufacturing yield evaluation of VLSI/WSI systems / [edited by] Bruno Ciciani.
- Publication
- Los Alamitos, CA : IEEE Computer Society Press, 1995.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Book/Text | Request in advance | JSF 96-813 | Offsite |
Details
- Additional Authors
- Ciciani, Bruno
- Description
- x, 437 p. : ill.; 28 cm.
- Subject
- Integrated circuits > Very large scale integration > Design and construction > Data processing
- Integrated circuits > Wafer-scale integration > Design and construction > Data processing
- Integrated circuits > Very large scale integration > Reliability
- Integrated circuits > Wafer-scale integration > Reliability
- Fault-tolerant computing
- Bibliography (note)
- Includes bibliographical references.
- Call Number
- JSF 96-813
- ISBN
- 0818662921
- LCCN
- 94020185
- OCLC
- 34971155
- Title
- Manufacturing yield evaluation of VLSI/WSI systems / [edited by] Bruno Ciciani.
- Imprint
- Los Alamitos, CA : IEEE Computer Society Press, 1995.
- Bibliography
- Includes bibliographical references.
- Added Author
- Ciciani, Bruno.
- Research Call Number
- JSF 96-813