Research Catalog
Intelligence tests their significance for school and society
- Title
- Intelligence tests [microform] : their significance for school and society / by Walter Fenno Dearborn.
- Author
- Dearborn, Walter Fenno, 1878-1955
- Publication
- Boston : Houghton Mifflin Co., c1928.
Items in the Library & Off-site
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1 Item
| Status | Vol/Date | Format | Access | Call Number | Item Location |
|---|---|---|---|---|---|
| 1-4 | Microform | Request in advance | *Z-6617 | Offsite |
Details
- Description
- xxiv, 336 p. : ill. (some col.); 19 cm.
- Donor/Sponsor
- National Endowment for the Humanities Preservation Grant 2, 1992/1994.
- Subject
- Bibliography (note)
- Includes bibliographical references (p. [317]-327) and index.
- Reproduction (note)
- Microfilm.
- Local note
- Library's copy lacking pp. 219-222.
- Call Number
- *Z-6617 no. 1
- OCLC
- NYPG93-B18463
- Author
- Dearborn, Walter Fenno, 1878-1955.
- Title
- Intelligence tests [microform] : their significance for school and society / by Walter Fenno Dearborn.
- Imprint
- Boston : Houghton Mifflin Co., c1928.
- Bibliography
- Includes bibliographical references (p. [317]-327) and index.
- Reproduction
- Microfilm. New York : New York Public Library, 1993. 1 microfilm reel ; 35 mm. (MN *ZZ-32977)
- Local Note
- Library's copy lacking pp. 219-222.
- Research Call Number
- *Z-6617 no. 1