Research Catalog

Digest of papers.

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Item details
Status	Vol/Date	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	1978	Book/text	Request in advance	JSP 79-42	Offsite
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	1977	Book/text	Request in advance	JSP 79-42	Offsite
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	1976	Book/text	Request in advance	JSP 79-42	Offsite
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	1973	Book/text	Request in advance	JSP 79-42	Offsite

Additional Authors

Publication Date

-1978.

Description

v. illus.; 28 cm.

Subject

Note

Annual.
Sponsored by the IEEE Computer Society and the Philadelphia Section of the IEEE.
Conference for 1973 called Symposium on Semiconductor Memory Testing; for 1977, called Semiconductor Test Symposium.

Call Number

JSP 79-42

OCLC

Conference

Semiconductor Test Conference.

Title

Digest of papers.

Imprint

New York, Institute of Electrical and Electronics Engineers.

Added Author

IEEE Computer Society.

Institute of Electrical and Electronics Engineers. Philadelphia Section.

Semiconductor Test Symposium.

Continued By

Test Conference. Digest of papers

Research Call Number

JSP 79-42 Library has: 1973, 1976-78.